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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Image Processing: Algorithms and Systems - Parameterization models for sampling planar curves

✍ Scribed by Poliannikov, Oleg V.; Krim, Hamid; Dougherty, Edward R.; Astola, Jaakko T.; Egiazarian, Karen O.

No coin nor oath required. For personal study only.

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