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SPIE Proceedings [SPIE ECO4 (The Hague '91) - The Hague, Netherlands (Monday 11 March 1991)] Industrial Applications of Holographic and Speckle Measuring Techniques - Spatial-carrier phase-shifting technique of fringe pattern analysis

โœ Scribed by Kujawinska, Malgorzata; Wojciak, Joanna; Jueptner, Werner P. O.


Book ID
118011944
Publisher
SPIE
Year
1991
Weight
361 KB
Volume
1508
Category
Article

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