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SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X - Hardware-in-the-loop test facility for the standard missile-3 kinetic warhead

✍ Scribed by Patchan, Robert M.; Murrer, Jr., Robert Lee

Book ID: 120986789
Publisher: SPIE
Year: 2005
Weight: 851 KB
Volume: 5785
Category: Article
DOI: 10.1117/12.603870

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