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SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX - Software-only IR image generation and reticle simulation for the HWIL testing of a single detector frequency modulated reticle seeker

✍ Scribed by Delport, Jan Peet; le Roux, Francois P. J.; du Plooy, Matthys J. U.; Theron, Hendrik J.; Annamalai, Leeandran; Murrer, Jr., Robert Lee

Book ID: 121341212
Publisher: SPIE
Year: 2004
Weight: 201 KB
Volume: 5408
Category: Article
DOI: 10.1117/12.541509

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