SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII - TOD test method for characterizing electro-optical system performance

✍ Scribed by McHugh, Stephen W.; Irwin, Alan; Valeton, J. M.; Bijl, Piet; Holst, Gerald C.

• Book ID: 120837672
• Publisher: SPIE
• Year: 2001
• Weight: 68 KB
• Volume: 4372
• Category: Article
• DOI: 10.1117/12.439159