๐”– Bobbio Scriptorium
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SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII - TOD test method for characterizing electro-optical system performance

โœ Scribed by McHugh, Stephen W.; Irwin, Alan; Valeton, J. M.; Bijl, Piet; Holst, Gerald C.


Book ID
120837672
Publisher
SPIE
Year
2001
Weight
68 KB
Volume
4372
Category
Article

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