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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 8 April 1996)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing - Performance capabilities and utilization of MICOM's diode-laser-based infrared scene projector technology

โœ Scribed by Beasley, D. Brett; Cooper, John B.; Murrer, Jr., Robert Lee


Book ID
121010788
Publisher
SPIE
Year
1996
Weight
639 KB
Volume
2741
Category
Article

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