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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of non-common path static aberrations in an interferometric camera by phase diversity

✍ Scribed by Yan, Zhaojun; Herbst, Thomas M.; Yang, Pengqian; Bizenberger, Peter; Zhang, Xianyu; Conrad, Albert R.; Bertram, Thomas; Kuerster, Martin; Rix, Hans-Walter; Li, Xinyang; Rao, Changhui; Zhang, Yudong; Xiang, Libin; To, Sandy

Book ID: 121232961
Publisher: SPIE
Year: 2012
Weight: 230 KB
Volume: 8417
Category: Article
DOI: 10.1117/12.974523

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