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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Mobility spectrum analysis of ion-etching-induced p-to-n type converted layers in HgCdTe single crystal

โœ Scribed by Xu, Guoqing; Liu, Xiangyang; Zhang, Kefeng; Qiao, Hui; Jia, Jia; Li, Xiangyang; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng


Book ID
121232281
Publisher
SPIE
Year
2012
Weight
272 KB
Volume
8419
Category
Article

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