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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Research on voltage characteristic of the third generation low-light-level image intensifier tube's output signal to noise ratio

✍ Scribed by Bai, Xiaofeng; Yin, Lei; Hu, Wen; Shi, Feng; Hou, Zhipeng; Shi, Hongli; He, Yingping; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 121231565
Publisher: SPIE
Year: 2012
Weight: 181 KB
Volume: 8419
Category: Article
DOI: 10.1117/12.975774

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