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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Application of image entropy evaluation function for the leveling of large aperture components in auto defects detecting

✍ Scribed by Cao, Pin; Liu, Dong; Zhao, Peng; Yang, Yong-ying; Wang, Shi-tong; Zhang, Yudong; Xiang, Libin; To, Sandy

Book ID: 121215441
Publisher: SPIE
Year: 2012
Weight: 301 KB
Volume: 8417
Category: Article
DOI: 10.1117/12.976036

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