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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on digital calibration method for optical surface defect dimension

✍ Scribed by Chen, Xiaoyu; Liu, Dong; Wang, Shitong; Cao, Pin; Gao, Xin; Yang, Yongying; Zhang, Yudong; Xiang, Libin; To, Sandy

Book ID: 120795068
Publisher: SPIE
Year: 2012
Weight: 769 KB
Volume: 8417
Category: Article
DOI: 10.1117/12.976030

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