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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Analysis of dark current in long-wavelength HgCdTe junction diodes at low temperature and an approximate method to calculate the trap density of depletion region

✍ Scribed by Hua, Hua; Xie, Xiaohui; Hu, Xiaoning; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 120795067
Publisher: SPIE
Year: 2012
Weight: 292 KB
Volume: 8419
Category: Article
DOI: 10.1117/12.975948

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