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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Design of an IRFPA point-by-point bias calibration

✍ Scribed by He, Wei; Lv, Jian; Zhou, Yun; Du, Yiying; Yu, Caideng; Xie, Guangzhong; Yuan, Kai; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 120733633
Publisher: SPIE
Year: 2012
Weight: 296 KB
Volume: 8419
Category: Article
DOI: 10.1117/12.971176

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