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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing - Diffracted beam parameters of TE 0 mode symmetrical MQW planar waveguide

✍ Scribed by Guo, Fuyuan; Li, Lianhuang; Zheng, Hua; Lin, Xiangdi; Namba, Yoshiharu; Xing, Tingwen

Book ID: 120643325
Publisher: SPIE
Year: 2012
Weight: 186 KB
Category: Article
DOI: 10.1117/12.975931

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