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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Studying of linearly graded buffer layer effect on quality of InGaAs on GaAs substrate

✍ Scribed by Jiao, Gangcheng; Liu, Zhengtang; Shi, Feng; Zhang, Liandong; Cheng, Wei; Wang, Shufei; Zhou, Yujian; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 120638599
Publisher: SPIE
Year: 2012
Weight: 439 KB
Volume: 8419
Category: Article
DOI: 10.1117/12.977611

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