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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Wavefront error sensing based on phase diversity technology and image restoration

✍ Scribed by Cheng, Qiang; Li, Fazhi; Tao, Xiaoping; Yan, Feng; Zhang, Xuejun; Zhang, Yudong; Xiang, Libin; To, Sandy

Book ID: 120623201
Publisher: SPIE
Year: 2012
Weight: 668 KB
Volume: 8417
Category: Article
DOI: 10.1117/12.970394

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