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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Growth and characterization of high Nd-concentration single crystals La x Nd 1-x PO 4

✍ Scribed by Wang, Yongzheng; Li, Jing; Wang, Jiyang; Han, Shujuan; Guo, Yongjie; Zhao, Lanling; Zhang, Yang; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 120061868
Publisher: SPIE
Year: 2012
Weight: 590 KB
Category: Article
DOI: 10.1117/12.975923

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