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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Autofocus method in digital holographic microscopy

✍ Scribed by Liu, Jingbo; Song, Xiufa; Han, Rui; Wang, Huaying; Zhang, Yudong; Wyant, James C.; Smythe, Robert A.; Wang, Hexin

Book ID: 120486192
Publisher: SPIE
Year: 2009
Weight: 717 KB
Volume: 7283
Category: Article
DOI: 10.1117/12.828788

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