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SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - X-Ray/EUV Multilayers: Promise And Pitfalls

โœ Scribed by Harvey, James E.; Zmek, William P.; Moran, Edward C.; Hoover, Richard B.


Book ID
121303228
Publisher
SPIE
Year
1989
Weight
634 KB
Volume
1160
Category
Article

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