SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Imaging II - Simultaneous, Nondestructive Analysis Of Thickness And Composition Of Multilayer Metal Films Using A Fundamental Parameter XRF Approach.

✍ Scribed by Linder, R.; Kladnik, G.; Augenstine, J.; Bowen, D. Keith; Knight, Larry V.

• Book ID: 120525946
• Publisher: SPIE
• Year: 1986
• Weight: 155 KB
• Volume: 691
• Category: Article
• DOI: 10.1117/12.936617