SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Optical System Design, Analysis, and Production - The Calculation Of Wave Aberration Coefficients And Wave Aberration Derivatives From Ray Trace Data

✍ Scribed by Wilczynski, J. S.; Tibbetts, R. E.; Fischer, Robert E.; Rogers, Philip J.

• Book ID: 118273498
• Publisher: SPIE
• Year: 1983
• Weight: 321 KB
• Volume: 399
• Category: Article
• DOI: 10.1117/12.935425