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SPICE Behavioral Model of the Tunneling Field-Effect Transistor for Circuit Simulation

✍ Scribed by Yibin Hong; Yue Yang; Litao Yang; Samudra, G.; Chun-Huat Heng; Yee-Chia Yeo

Book ID: 115466180
Publisher: Institute of Electrical and Electronics Engineers
Year: 2009
Tongue: English
Weight: 237 KB
Volume: 56
Category: Article
ISSN: 1549-7747
DOI: 10.1109/tcsii.2009.2035274

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