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Specular X-ray reflectivity study of interfacial SiO2layer in thermally annealed NiO/Si assembly

โœ Scribed by Mitra, Subarna; Chakraborty, Suvankar; Menon, Krishnakumar S. R.


Book ID
125345053
Publisher
Springer
Year
2014
Tongue
English
Weight
684 KB
Volume
117
Category
Article
ISSN
1432-0630

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