Specular X-ray reflectivity study of interfacial SiO2layer in thermally annealed NiO/Si assembly

✍ Scribed by Mitra, Subarna; Chakraborty, Suvankar; Menon, Krishnakumar S. R.

• Book ID: 125345053
• Publisher: Springer
• Year: 2014
• Tongue: English
• Weight: 684 KB
• Volume: 117
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-014-8500-6