Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

✍ Scribed by Sonnichsen, C.; Geier, S.; Hecker, N. E.; von Plessen, G.; Feldmann, J.; Ditlbacher, H.; Lamprecht, B.; Krenn, J. R.; Aussenegg, F. R.; Chan, V. Z-H.; Spatz, J. P.; Moller, M.

• Book ID: 115531776
• Publisher: American Institute of Physics
• Year: 2000
• Tongue: English
• Weight: 430 KB
• Volume: 77
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1323553