Spectroscopy and High-Resolution Microscopy of Single Nanocrystals by a Focused Ion Beam Registration Method

✍ Scribed by Carolina Novo; Alison M. Funston; Isabel Pastoriza-Santos; Luis M. Liz-Marzán; Paul Mulvaney

• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 244 KB
• Volume: 119
• Category: Article
• ISSN: 0044-8249
• DOI: 10.1002/ange.200700033