Spectroscopic second harmonic generation as a diagnostic tool in silicon materials processing

✍ Scribed by J. J. H. Gielis; A. A. E. Stevens; P. M. Gevers; H. C. W. Beijerinck; M. C. M. van de Sanden; W. M. M. Kessels

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 179 KB
• Volume: 2
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200562219