✦ LIBER ✦
Spectroscopic reflectometry as in-operando method for thickness determination of anodic oxide films on titanium
✍ Scribed by Schneider, M.; Langklotz, U.; Michaelis, A.
- Book ID
- 120578830
- Publisher
- John Wiley and Sons
- Year
- 2013
- Tongue
- English
- Weight
- 664 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0142-2421
- DOI
- 10.1002/sia.5262
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