✦ LIBER ✦
Spectroscopic ellipsometry study of wurtzite InN epitaxial films on Si(111) with varied carrier concentrations
✍ Scribed by Ahn, H.; Shen, C.-H.; Wu, C. -L.; Gwo, S.
- Book ID
- 121509192
- Publisher
- American Institute of Physics
- Year
- 2005
- Tongue
- English
- Weight
- 340 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0003-6951
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