Spectroscopic ellipsometry study of GaAs[sub 1−x]Bi[sub x] material grown on GaAs substrate by atmospheric pressure metal-organic vapor-phase epitaxy

✍ Scribed by Ben Sedrine, Nebiha; Moussa, Imed; Fitouri, Hedi; Rebey, Ahmed; El Jani, Belgacem; Chtourou, Radhouane

• Book ID: 119948822
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 625 KB
• Volume: 95
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3167359