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Spectroscopic ellipsometry analysis for investigation of the modification of thin film p-a-Si1−xCx:H after ultraviolet treatment in an Argon ambient

✍ Scribed by Seung Yeop Myong; Sang Soo Kim; Koeng Su Lim


Book ID
113936763
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
251 KB
Volume
455-456
Category
Article
ISSN
0040-6090

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