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Spectroscopic characterization of thiol-derived self-assembling monolayers

✍ Scribed by Zharnikov, M; Grunze, M


Book ID
121388892
Publisher
Institute of Physics
Year
2001
Tongue
English
Weight
707 KB
Volume
13
Category
Article
ISSN
0953-8984

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## Abstract Herein, the scanning electrochemical microscopy (SECM) approach is applied to study the formation of thiol‐porphyrin self‐assembled monolayer (SAMs). Using cyclic voltammetry (CV), the formation process is characterized adopting different probe molecules. The observed phenomena indicate