The determination of trace amounts of silicon in copper and copperbase al lays I Utwrrsrt STANPARXX INSTITUTION, KS. I 748: Part 7: xc)Go, Methods /or rlrc rl~rctfysis of Copper Alloys. Pctvt 7. Silicora (~hofornclvic urcfhodj.
Spectrophotometric determination of traces of silicon in pure copper and copper alloys
β Scribed by P. Pakalns
- Publisher
- Elsevier Science
- Year
- 1968
- Tongue
- English
- Weight
- 288 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0003-2670
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