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Spectral characterisation of new organic fluorescent dyes with an alkoxysilane moiety and their utilisation for the labelling of layered silicates

✍ Scribed by Danko, Martin; Mičušík, Matej; Omastová, Mária; Bujdák, Juraj; Chorvát, Dušan


Book ID
119932371
Publisher
Versita
Year
2013
Tongue
English
Weight
555 KB
Volume
67
Category
Article
ISSN
0366-6352

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✦ Synopsis


Dedicated to Professor Štefan Toma on the occasion of his 75th birthday

New fluorescence dyes with an alkoxysilane moiety were synthesised by the condensation of 3-(triethoxysilyl)-1-propanamine (3-aminopropyltriethoxysilane) with 4,10-benzothioxanthene-3,1dicarboxylic acid anhydride (BTXA) and N,N-dimethylaminonaphthalene-1,8-dicarboxylic acid anhydride (DMANA), which was accompanied by the formation of an imidic bridge. The compounds N-(3-(triethoxysilyl)propyl)-thioxantheno[2,1,9-dej]isoquinoline-1,3-dione (BTX-S) and 4-(N ,N -dimethyl)-N-(triethoxysilyl)propyl-1,8-naphthalene dicarboxylic acid imide (DMAN-S) were characterised by steady-state and time-resolved fluorescence spectroscopy in chloroform and ethanol. Both conjugates (BTX-S and DMAN-S) exhibited absorption and emission bands in the same region as the un-substituted BTXA and DMANA. An important Stokes shift was observed for DMAN-S in ethanol. A high fluorescence quantum yield was observed for BTX-S in both solvents and for DMAN-S in chloroform. In addition, the newly developed fluorescent silane dyes were covalently attached to the microscopic particles of layered silicates and on the surface of SiO2 wafers as a proof of concept for fluorescence particle (surface) visualisation. The surface wafer modification was precisely characterised by X-ray photoelectron spectroscopy (XPS). Successful covalent linkage onto the particles of layered silicates was proved by confocal laser scanning microscopy technique.


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Erratum to: “Martin Danko, Matej Mičušík
✍ Martin Danko,Matej Mičušík,Mária Omastová,Juraj Bujdák… 📂 Article 📅 2014 🏛 Versita 🌐 English ⚖ 86 KB

On page 26 of the original article by Danko et al. (2013), incorrect Fig. 7 and figure caption were given. Below, Fig. 7 and related figure caption are corrected. Fig. 7. Deconvolution of high resolution XPS spectra of the doublet subtracted Si2p of Si wafer (a) and DMAN-S modified wafer (b). -Si w