Spectral analysis for the effect of stylus tip curvature on measuring rough profiles
โ Scribed by Jiunn-Jong Wu
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 236 KB
- Volume
- 230
- Category
- Article
- ISSN
- 0043-1648
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โฆ Synopsis
Spectral analysis and computer simulation are adopted to investigate the tracing of a random profile with a mechanical profiler with a spherical tipped stylus. It is shown that the measuring error strongly depends on the ratio of the radius of stylus tip r to the rms roughness s and the ratio of the 1re correlation distance b to the rms roughness s . By using the concept of critical wave number, spectral density of measured profile can be estimated. Also, formulas are developed to estimate the rms error and the critical sampling interval.
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