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Specimen Preparation, Imaging, and Analysis Protocols for Knife-edge Scanning Microscopy

โœ Scribed by Choe, Yoonsuck; Mayerich, David; Kwon, Jaerock; Miller, Daniel E.; Sung, Chul; Chung, Ji Ryang; Huffman, Todd; Keyser, John; Abbott, Louise C.

Book ID
115487321
Publisher
MyJoVE Corporation
Year
2011
Tongue
English
Weight
600 KB
Volume
58
Category
Article
ISSN
1940-087X

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Beam profiling by vibrating knife edge:
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โœ A. Korpel; D. J. Mehrl; S. Samson ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 490 KB

We show theoretically and experimentally that beam profiling with a vibrating knife exhibits spatial resolution equal to the knife-edge excursion. We discuss the implications of this for near-field optical scanning microscopy, propose an extension of the method to two dimensions, and calculate impul