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Specimen cooling in a cooled object chamber in the electron microscope

โœ Scribed by P. F. Elbers


Publisher
Springer
Year
1966
Tongue
English
Weight
289 KB
Volume
53
Category
Article
ISSN
0028-1042

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Optimal imaging of complex structures requires proper alignment relative to the optic axis of the electron microscope. This is especially important for high-voltage and intermediatevoltage microscopes, which form an in-focus image throughout the entire thickness of the object. As a result, structure