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Specific contact resistances between amorphous oxide semiconductor In–Ga–Zn–O and metallic electrodes

✍ Scribed by Yasuhiro Shimura; Kenji Nomura; Hiroshi Yanagi; Toshio Kamiya; Masahiro Hirano; Hideo Hosono


Book ID
108289938
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
460 KB
Volume
516
Category
Article
ISSN
0040-6090

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Relationship between non-localized tail
✍ Nomura, K. ;Kamiya, T. ;Ohta, H. ;Shimizu, K. ;Hirano, M. ;Hosono, H. 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 375 KB

## Abstract The relationship between non‐localized tail states and carrier transport in transparent amorphous oxide semiconductor, In–Ga–Zn–O (a‐IGZO), was investigated. It was found that the energy width (__E__~0~) of the non‐localized tail states varied from <7 meV to 20 meV depending on the film