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Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir–Blodgett ultrathin films

✍ Scribed by Lecourt, B.; Blaudez, D.; Turlet, J.-M.


Book ID
115388509
Publisher
Optical Society of America
Year
1998
Tongue
English
Weight
848 KB
Volume
15
Category
Article
ISSN
1084-7529

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