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Special issue on Statistical and Probabilistic Methods for Metrology

✍ Scribed by Bich, Walter; Cox, Maurice G

Book ID: 111873543
Publisher: Institute of Physics
Year: 2006
Tongue: English
Weight: 42 KB
Volume: 43
Category: Article
ISSN: 0026-1394
DOI: 10.1088/0026-1394/43/4/e01

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