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Special Issue on Advanced Electron Microscopy Studies of High-temperature Superconductors

โœ Scribed by Y Zhu


Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
18 KB
Volume
30
Category
Article
ISSN
0968-4328

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๐Ÿ“œ SIMILAR VOLUMES


Temperature stabilized sample stage for
โœ R Gross; J Bosch; H.-G Wener; J Fischer; R.P Huebener ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 491 KB

A cryogenic sample stage for scanning electron microscopes is described. The setup allows performance of measurements in the temperature range from 1.5 K to 300 K. During the measurements the sample can be irradiated directly by the electron beam. The sample temperature can be stabilized by a temper