Spatial retardation of carrier heating in scaled 0.1-μm n-MOSFET's using Monte Carlo simulations

✍ Scribed by Hulfachor, R.B.; Ellis-Monaghan, J.J.; Kim, K.W.; Littlejohn, M.A.

• Book ID: 114536436
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 435 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.485550