Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

✍ Scribed by Andricek, Ladislav; Doležal, Zdeněk; Drásal, Zbyněk; Fischer, Peter; KodyÅ¡, Peter; Kohrs, Robert; Kvasnička, Peter; Mariñas, Carlos; Reuen, Lars; Rummel, Stefan; Schmieden, Kristof; Velthuis, Jaap J.; Vos, Marcel

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 455 KB
• Volume: 604
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2009.01.097