✦ LIBER ✦
Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy
✍ Scribed by Ibrahim, Imad; Rümmeli, Mark H; Ranjan, Nitesh; Büchner, Bernd; Cuniberti, Gianaurelio
- Book ID
- 121240398
- Publisher
- Institute of Physics
- Year
- 2013
- Tongue
- English
- Weight
- 753 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0957-4484
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