Spatial distribution of damage caused by 6.4 eV photon irradiation in the gate oxide MOSFET's

✍ Scribed by M. Brox; F. Hofmann; W. Weber

• Book ID: 107925773
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 259 KB
• Volume: 39
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(89)90460-1