Sources of contamination to weak lensing tomography: redshift-dependent shear measurement bias

✍ Scribed by Elisabetta Semboloni; Ismael Tereno; Ludovic Van Waerbeke; Catherine Heymans

• Book ID: 110093701
• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 889 KB
• Volume: 397
• Category: Article
• ISSN: 0035-8711
• DOI: 10.1111/j.1365-2966.2009.14926.x