𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Some studies on the instability in MOS devices due to water vapour contamination : B. R. Singh, B. D. Ryagi and B. R. Marathe. Int. J. Electron.41 (3), 273 (1976)


Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
86 KB
Volume
16
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.