Some stress—strength reliability models : Who Kee Chung. Microelectron. Reliab.22 (2), 277 (1982)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 127 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91063-6