✦ LIBER ✦

Some problems of electron spectroscopy (AES, EPES) using a retarding field analyser

✍ Scribed by A. Sulyok; G. Gergely; B. Gruzza; L. Bideux

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 239 KB
Volume: 45
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(94)90202-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The application of digital techniques fo

The application of digital techniques for electron energy spectroscopy using a retarding field analyser

✍ H. Zeijlemaker; J. Verhoeven 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 259 KB

Determination of the inelastic mean free

Determination of the inelastic mean free path (IMFP) of electrons in germanium and silicon by elastic peak electron spectroscopy (EPES) using an analyser of high resolution

✍ G Gergely; A Konkol; M Menyhard; B Lesiak; A Jablonski; D Varga; J Toth 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 380 KB

The IMFP of electrons is a fundamental material parameter of surface analysis by AES, XPS, EPES and EELS. In surface analysis calculated IMFP values are used. Their experimental determination is rather difficult The IMFP of amorphous Ge and polycrysralline Si was determined by comparing rhe elastic