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Some Misconceptions about Attribute Sampling Plans

โœ Scribed by Steve H.K. Ng


Book ID
108543198
Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
105 KB
Volume
23
Category
Article
ISSN
0141-982X

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โœ George Tagaras; Hau L. Lee ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 570 KB

In this article we study the properties of the optimal Bayesian single-sampling plans when the prior distribution of the lot fraction defective is modified Beta, which has been found useful in the analysis of inspection schemes for complex production systems. These properties are used to devise an i