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Some critical remarks on a hierarchy of fault-detecting abilities of test methods [and reply]

✍ Scribed by DeMillo, R.A.; Mathur, A.P.; Wong, W.E.; Frankl, P.G.; Weyuker, E.J.


Book ID
117872121
Publisher
IEEE
Year
1995
Tongue
English
Weight
676 KB
Volume
21
Category
Article
ISSN
0098-5589

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